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KOMKIA Insights

Design for Testability (DFT)

Design for Testability (DFT)

Design for Testability (DFT)

Access, boundary scan and self-test provisions make the board verifiable at volume without rework.

Test access

Reserve probe pads and vias for ICT and flying probe.

Boundary scan

JTAG eases complex, dense boards.

Built-in self-test

Simple loops catch faults before shipment.

Key Takeaways

Key Takeaways

  • Reserve test points early.
  • Use JTAG for dense boards.
  • Add self-test where practical.
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